Fig. 3. Scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM-EDS) analysis of the failed implant. SEM micrograph at ×500 and ×10,000 magnifications, EDS elemental distribution map, and spectrum of representative points on the failed implants. U: microfracture (white arrowheads) and scratching lines (black arrows) are observed. The elemental distribution map showed a homogeneous oxidized Ti surface with particles composed of C and Si. M: normal bone structure with bony lacunae covering the fixture surface (blue arrowheads). The Ti surface was detected on EDS in the region with a thin bone layer (black arrowheads). B: SEM images showing irregular bone structure with the presence of organic matter (blue arrowheads). EDS results reveal the presence of Na, F, N, Si, and Au. A: normal bone structure with lacunae covering the fixture surface (blue arrowheads). Trace amounts of Ti can be observed in the elemental distribution map (black arrowheads). (cps/eV: count per second per electron-volt)

J Korean Assoc Oral Maxillofac Surg 2023;49:43~48
https://doi.org/10.5125/jkaoms.2023.49.1.43

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