Fig. 2. Scanning electron microscopy photograph of the failed implant at ×65 magnification. The regions of interest examined by energy dispersive X-ray spectroscopy at ×10,000 magnifications are marked with red rectangles. U: surface in the upper area of the fixture, adjacent to the fracture region, M: implant surface at the middle of the implant fixture, B: attached bone tissue in the middle region of the fixture, A: implant surface in the apical region of the implant.

J Korean Assoc Oral Maxillofac Surg 2023;49:43~48
https://doi.org/10.5125/jkaoms.2023.49.1.43

© JKAOMS